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Side view PM2000,
with glove box (optional)
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Front view ICP process chamber opened,
with laser endpoint detection system |
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PM2000 with RIE/ICP process
chamber and Laser end point detection system. Depending on your
application it can be fitted either with a Reactive Ion Etch (RIE), a
Inductive Coupled Plasma (ICP) or Plasma Enhanced Chemical Vapor
Deposition (PECVD) process chamber.
The system is used for Semiconductor-, MEMS-, Packaging and Failure
Analyses (FA) applications. Etching of silicon, nitrides, oxides,
polymers, metals and compound semiconductors is accomplished safely and
reproducibly in this reliable, cost efficient yet high performance
system.
Your desired etch profile, whether anisotropic requiring high aspect
ratios, or sloped walls, is achieved with the PM2000. The wide variety
of etch profiles is achieved by applying a DC bias on the electrode,
which can be fitted with an electrostatic chuck for optimal thermal
control.
Etch Rates and Uniformity
Fast etch rates are achieved using solid state 600 watt generators and
the unique chamber design which allows for upgrading from RIE to ICP at
any later stage. The precise mixing of gases, pressure and power
optimizes process selectivity. Mass flow controllers provide precise and
reproducible gas flow. A load lock system is optionally available.
Computer control
The PM2000 is fully computer controlled
using an industrial PC running Windows XP and an industrial field bus
network. The system comes with an easy to use computerized touch panel
for parameter control, recipe entry and data logging.

PM2000 process
module online visualization |
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Features
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Single wafer, Plasma etch & PECVD systems for
R&D, Failure Analysis, MEMS
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Compact plasma sources, RIE-ICP-PECVD, etch,
descum and deposition processes
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Max 200 mm wafer processing
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Vacuum load lock extendable
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Small foot print, gas system and power box
fully integrated
Benefits
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Compact system (footprint 80 x 100 cm incl.
gas handling system)
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RIE system can be upgraded to a RIE/ICP
system
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Optional with vacuum load lock
Dimensions
Reactor
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Aluminum reactor suitable for processing
wafers up to 200 mm
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Optional electrostatic chuck with helium
backside cooling
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Control System
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Automatic RF tuning
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Baratron pressure gauge for independent
pressure control
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Standard 2 mass flow controllers (optional up
to 8)
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Windows ® compatible
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Optional optical or laser endpoint detection
Safety
CE approved

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